1. 个人经历：
博士研究生（半导体材料与器件方向），英国谢菲尔德大学 （2018）。
硕士研究生（光子学），瑞典皇家理工学院 （2014）。
英国皇家显微学协会会员。
英国物理协会会员。
2. 研究方向：
- 分析式透射电子显微学方法论及光致发光光谱学方法论，包括介电电子能量损失谱，X光能谱及原位光致发光光谱学。
- 基于电子束感生电流系统的表面/界面载流子迁移机理
- 合金氮化物的量子结构的表征。
- III-V氮化物的高能电子损伤机理。
2021
Directional charge transportation and Rayleigh scattering for the optimal in-band quantum yield of a composite semiconductor nano-photocatalyst
X.Y. Wang, W.Y. Hu, Y.Q, Y.H, X.Q. Wang, M. Xu, J. Ma, F. Miao, X.D. Cui, C.Y. Jin, P. Ruterana
Catalysis Science & Technology
2019
A bi-layer buffer system AlN/Al1−xInxN to enable the growth of high crystal quality Al0.36In0.64N thin films on Si (111)
W. Lu, X.Y. Wang, Y. Ma, S. Grasso, M. Xu
CrystEngComm, vol. 21, pp. 5211-5215, 2019.
2018
Self-consistent absorption correction for quantifying very noisy X-ray maps: group III nitride nanowire as an example
X.Y. Wang, J. Bai, T. Walther
Journal of Microscopy, vol. 272, issue. 2, pp. 111-122, 2018.
2017
Effective absorption correction for energy dispersive X-ray spectroscopy in a scanning transmission electron microscope: analyzing the indium distribution in rough samples of InGaN alloy layers
X.Y. Wang, M-P. Chauvat, P. Ruterana, T. Walther
Journal of Microscopy, vol. 268, pp. 248-253, 2017.
Study of phase separation in an InGaN alloy by electron energy loss spectroscopy in an aberration corrected monochromated scanning transmission electron microscope
T. Walther, X.Y. Wang, V.C. Angadi, P. Ruterana, P. Longo, T. Aoki
Journal of Materials Research, vol. 32, issue. 5, pp. 983-995, 2017.
2016
Investigation of phase separation in InGaN alloys by plasmon loss spectroscopy in a TEM
X.Y. Wang, M-P. Chauvat, P. Ruterana, T. Walther
MRS Advances, vol. 1, issue. 40, pp. 2749-2756, 2016.
Self-consistent method for quantifying indium content from X-ray spectra of thick compound semiconductor specimens in a transmission electron microscope
T. Walther, X.Y. Wang
Journal of Microscopy, vol. 262, issue. 2, pp. 151-156, 2016.
2015
Combination of electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy to determine indium concentration in InGaN thin film structures
X.Y. Wang, M-P Chauvat, P. Ruternana, T. Walther
Semiconductor Science and Technology, vol. 30, issue. 11, 114011, 2015.
Self-consistent absorption correction for quantitative energy-dispersive X-ray spectroscopy of InGaN layers in analytical transmission electron microscopy
T. Walther, X.Y. Wang
Journal of Physics: Conference Series, vol. 644, issue.1, 012006, 2015.